Lorin Mueller

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2025

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Compare Several Supervised Machine Learning Methods in Detecting Aberrant Response Pattern
Yi Lu | Yu Zhang | Lorin Mueller
Proceedings of the Artificial Intelligence in Measurement and Education Conference (AIME-Con): Full Papers

An aberrant response pattern, e.g., a test taker is able to answer difficult questions correctly, but is unable to answer easy questions correctly, are first identified lz and lz*. We then compared the performance of five supervised machine learning methods in detecting aberrant response pattern identified by lz or lz*.
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