@inproceedings{betts-muntean-2025-evaluating,
title = "Evaluating Deep Learning and Transformer Models on {SME} and {G}en{AI} Items",
author = "Betts, Joe and
Muntean, William",
editor = "Wilson, Joshua and
Ormerod, Christopher and
Beiting Parrish, Magdalen",
booktitle = "Proceedings of the Artificial Intelligence in Measurement and Education Conference (AIME-Con): Works in Progress",
month = oct,
year = "2025",
address = "Wyndham Grand Pittsburgh, Downtown, Pittsburgh, Pennsylvania, United States",
publisher = "National Council on Measurement in Education (NCME)",
url = "https://preview.aclanthology.org/ingest-emnlp/2025.aimecon-wip.17/",
pages = "141--146",
ISBN = "979-8-218-84229-1",
abstract = "This study leverages deep learning, transformer models, and generative AI to streamline test development by automating metadata tagging and item generation. Transformer models outperform simpler approaches, reducing SME workload. Ongoing research refines complex models and evaluates LLM-generated items, enhancing efficiency in test creation."
}Markdown (Informal)
[Evaluating Deep Learning and Transformer Models on SME and GenAI Items](https://preview.aclanthology.org/ingest-emnlp/2025.aimecon-wip.17/) (Betts & Muntean, AIME-Con 2025)
ACL
- Joe Betts and William Muntean. 2025. Evaluating Deep Learning and Transformer Models on SME and GenAI Items. In Proceedings of the Artificial Intelligence in Measurement and Education Conference (AIME-Con): Works in Progress, pages 141–146, Wyndham Grand Pittsburgh, Downtown, Pittsburgh, Pennsylvania, United States. National Council on Measurement in Education (NCME).