@inproceedings{lu-etal-2025-compare,
    title = "Compare Several Supervised Machine Learning Methods in Detecting Aberrant Response Pattern",
    author = "Lu, Yi  and
      Zhang, Yu  and
      Mueller, Lorin",
    editor = "Wilson, Joshua  and
      Ormerod, Christopher  and
      Beiting Parrish, Magdalen",
    booktitle = "Proceedings of the Artificial Intelligence in Measurement and Education Conference (AIME-Con): Full Papers",
    month = oct,
    year = "2025",
    address = "Wyndham Grand Pittsburgh, Downtown, Pittsburgh, Pennsylvania, United States",
    publisher = "National Council on Measurement in Education (NCME)",
    url = "https://preview.aclanthology.org/ingest-emnlp/2025.aimecon-main.3/",
    pages = "21--24",
    ISBN = "979-8-218-84228-4",
    abstract = "An aberrant response pattern, e.g., a test taker is able to answer difficult questions correctly, but is unable to answer easy questions correctly, are first identified lz and lz*. We then compared the performance of five supervised machine learning methods in detecting aberrant response pattern identified by lz or lz*."
}