Attention Under Attack: Analog Noise Effects and Mechanistic Vulnerabilities in Transformer Models

Mafizur Rahman, Lijun Qian


Abstract
Analog in-memory computing (AIMC) offers substantial efficiency gains for transformer inference but introduces hardware-induced noise that can distort attention behavior. Prior studies primarily focus on AIMC evaluations for vision tasks and CNN-based models. They largely overlook how hardware-induced noise perturbs internal attention dynamics in NLP models. In this work, we present the first fine-grained analysis of analog vulnerability in pretrained transformers, examining projection submodules, attention heads, and layer-wise dynamics across multiple NLP tasks. Results show that query (Q), key (K), and value (V) projections are the most sensitive components, while feed-forward layers remain comparatively robust. Also, analog noise yields depth-dependent degradation in higher layers, leading to scattered attention and disrupted token routing. This pre-deployment analysis mitigates potential resource misuse before physical deployment and offers practical guidance for designing noise-resilient analog NLP transformers.
Anthology ID:
2026.acl-short.21
Volume:
Proceedings of the 64th Annual Meeting of the Association for Computational Linguistics (Volume 2: Short Papers)
Month:
July
Year:
2026
Address:
San Diego, California, United States
Editors:
Maria Liakata, Viviane P. Moreira, Jiajun Zhang, David Jurgens
Venue:
ACL
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Publisher:
Association for Computational Linguistics
Note:
Pages:
227–237
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URL:
https://preview.aclanthology.org/ingest-acl/2026.acl-short.21/
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Cite (ACL):
Mafizur Rahman and Lijun Qian. 2026. Attention Under Attack: Analog Noise Effects and Mechanistic Vulnerabilities in Transformer Models. In Proceedings of the 64th Annual Meeting of the Association for Computational Linguistics (Volume 2: Short Papers), pages 227–237, San Diego, California, United States. Association for Computational Linguistics.
Cite (Informal):
Attention Under Attack: Analog Noise Effects and Mechanistic Vulnerabilities in Transformer Models (Rahman & Qian, ACL 2026)
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