Towards automatic quality assessment of component metadata
Thorsten Trippel | Daan Broeder | Matej Durco | Oddrun Ohren
Proceedings of the Ninth International Conference on Language Resources and Evaluation (LREC'14)
Measuring the quality of metadata is only possible by assessing the quality of the underlying schema and the metadata instance. We propose some factors that are measurable automatically for metadata according to the CMD framework, taking into account the variability of schemas that can be defined in this framework. The factors include among others the number of elements, the (re-)use of reusable components, the number of filled in elements. The resulting score can serve as an indicator of the overall quality of the CMD instance, used for feedback to metadata providers or to provide an overview of the overall quality of metadata within a reposi-tory. The score is independent of specific schemas and generalizable. An overall assessment of harvested metadata is provided in form of statistical summaries and the distribution, based on a corpus of harvested metadata. The score is implemented in XQuery and can be used in tools, editors and repositories.